Nicolas Moltmann

Nicolas Moltmann studied physics and computer science at the Technical University of Berlin. In his thesis, he examined the suitability of spectral ellipsometry – an optical measurement technique – for the characterization of thin film semiconductors

During his studies, Nicolas Moltmann worked as a tutor for students designing and building demonstration experiments. During his period of employment at the radiation measuring station in Berlin, he expanded his knowledge of the computer-aided measurement technology used to determine radiation exposure.

Starting in 2006, Nicolas Moltmann worked as a patent professional for the Weisse & Wolgast law office. In 2009, he began training to become a patent attorney at the Weisse & Wolgast law office, the German Patent and Trade Mark Office, and the Federal Patent Court. In 2012, Nicolas Moltmann received his license as a German patent attorney. Together with Jörg Weisse and Volker Willems, he founded the Weisse, Moltmann & Willems Partnerschaftsgesellschaft in 2013.

Member of the German Association of Intellectual Property Experts (VPP), International Federation of Intellectual Property Attorneys (FICPI), German Chamber of Patent Attorneys, German Physical Society (DPG)

Technical Fields