Nicolas Moltmann

Nicolas Moltmann studied physics and computer science at Technische Universität Berlin. In his diploma thesis, he investigated the suitability of spectroscopic ellipsometry – an optical measurement technique – for the characterisation of thin semiconductor films.

During his studies, Nicolas Moltmann worked as a tutor, assisting students with the design and construction of demonstration experiments. While working at the Berlin radiation monitoring station, he further developed his expertise in computer-based measurement technology for determining radiological exposure.

Nicolas Moltmann joined the patent law firm Weisse & Wolgast in 2006 as a patent specialist. In 2009, he began his training as a German patent attorney at Weisse & Wolgast, the German Patent and Trade Mark Office and the Federal Patent Court. He was admitted as a German Patent Attorney in 2012. Together with Jörg Weisse and Volker Willems, he founded Weisse, Moltmann & Willems in 2013.

Member of the Association of Intellectual Property Experts (VPP), the International Federation of Intellectual Property Attorneys (FICPI), the German Chamber of Patent Attorneys and the German Physical Society (DPG).

Technical Fields